Beckman Coulter LS 13 320 XR Multiwavelength (MW) Laser Diffraction Particle Size Analyzer

Description

• Offers particle size distribution data from advanced Polarization Intensity Differential Scattering (PIDS) technology, which enables high-resolution measurements and an expanded dynamic range
• 3 light wavelengths (450, 600, & 900 nm) irradiate samples with vertical & horizontal polarized light
• The XR particle size analyzer provides fast, accurate results, and helps streamline workflows for optimal efficiency
• Dry Powder System (DPS) Module delivers reliable results from 400 nm to 3,500 μm for all types of homogeneous and heterogeneous samples that can be dispersed dry
• Universal Liquid Module (ULM) analyzes samples suspended in aqueous or non-aqueous dilutents ranging in size from 0.010 μm to 2000 μm
• Enhanced software simplifies method creation for standardized measurements
• Provides accurate, reliable detection of multiple particle sizes in a single sample
• New control standards adequately verify instrument/module performance
• ADAPT Software features pass/fail results for faster quality control
• High-security software configuration supports 21 CFR Part 11
• Direct measurement range from 0.010 μm to 3,500 μm
• Requires the LS 13 320 XR Workstation or customer-supplied Windows 10 PC that meets Beckman minimum specifications